Introduction

1.Ultra-Compact Probe Tip Using MEMS Technology

Developed probe tip with a 10um x 10um ultra-compact Pad for measuring electric and optical properties

2.Stage Ultra-Precise Stage with Precision Under 1um

Stage with 1um precision used with mass amounts of Micro-LED Chips, developed ultra-precise stage that can rapidly take measurements.

3.Dual measurement Optics (Electric/Optic Properties Dual Measurement)

Arranged so that measurements can be taken at once by accurately placing optical system configurations along with the electric properties area.
Time is saved since both properties are measured at the same time.

4.Mass Capacity Measurement Data Management and Processing

Mass Capacity/Accelerated Processing of Measured Data Management/Audit
Developed Related Algorithm and Database Technology