System introduction
The Micro-LED E/L Inspection System applies electrical signals to Micro-LED chips or panels, captures emitted light with cameras, and automatically evaluates emission, brightness, color, position, and defects for each pixel or chip.
I-PRECISION has also developed a MEMS-fabricated micro probe tip for simultaneous electrical and optical measurement on pads as small as 10 µm × 10 µm.
A high-precision multi-channel platform enables high-speed, high-volume testing and simultaneous multi-site E/L measurement. Accurate probe positioning reduces test time by measuring electrical and optical characteristics together.